Thickness. 4.2.1 Standard thickness *** 4.2.2 TV ***, center thickness of samples must not exceed *** of standard thickness. As illustration, a standard thickness of ***, center thickness of samples should fall within ***. 4.2.3 Normal distribution of the thickness of any batch of wafers should follow *** and the thickness of center in normal distribution is the standard thickness. For sample, a standard thickness of ***, TV*** (***), thickness of *** wafers falls within the range between ***, and the distribution of the thickness of sample wafers is normally directed to *** (See picture-2). 4.2.4 TTV should be measured by five-point method. The variation of wafer thickness should be less than *** of standard thickness. *** Picture-2
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Thickness. 4.2.1 Standard thickness ***
4.2.2 TV ***, center thickness of samples must not exceed *** of standard thickness. As illustration, a standard thickness of ***, center thickness of samples should fall within ***.
4.2.3 Normal distribution of the thickness of any batch of wafers should follow *** and the thickness of center in normal distribution is the standard thickness. For sample, a standard thickness of ***, TV*** (***), thickness of *** wafers falls within the range between ***, and the distribution of the thickness of sample wafers is normally directed to *** (See picture-2).
4.2.4 TTV should be measured by five-point method. The variation of wafer thickness should be less than *** of standard thickness. *** Picture-2.
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Sources: Solar Grade Polysilicon and Wafer Supply Agreement (GCL Silicon Technology Holdings Inc.)