Reflectors. Slope face deformation can be measured directly by optical surveying methods reflector prisms attached to selected nails allow for electronic deformation measurements of discreet points on the soil nail wall face. The survey system is typically capable of measuring horizontal and vertical displacements to accuracy of 3 mm (0.12 in.) or better.
Appears in 1 contract
Sources: Epc Agreement
Reflectors. Slope face deformation can be measured directly by optical surveying methods reflector prisms attached to selected nails allow for electronic deformation measurements of discreet points on the soil nail wall face. The survey system is typically capable of measuring horizontal and vertical displacements to accuracy of 3 mm (0.12 in.) or better. Load cells installed at the Soil Nail Head and Polymeric Reinforcement Facing are used to provide reliable information on the actual loads that are developed at the facing.
Appears in 1 contract
Sources: Epc Agreement